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[IEEE 2010 IEEE Holm Conference on Electrical Contacts (Holm 2010) - Charleston, SC, USA (2010.10.4-2010.10.7)] 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts - Temperature Measurement of Copper Contact Surfaces

✍ Scribed by Landfried, R.; Leblanc, T.; Andlauer, R.; Klonowski, T.; Teste, Ph.

Book ID: 120082489
Publisher: IEEE
Year: 2010
Weight: 1012 KB
Category: Article
ISBN: 1424481740
DOI: 10.1109/HOLM.2010.5619548

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