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[IEEE 2008 IEEE 17th Conference on Electrical Performance of Electronic Packaging (EPEP) - San Jose, CA, USA (2008.10.27-2008.10.29)] 2008 IEEE-EPEP Electrical Performance of Electronic Packaging - Parallel full-chip transient simulation at transistor level

✍ Scribed by Peng, He; Rouz, Khosro; Borah, Manjit; Cheng, Chung-Kuan

Book ID: 126652569
Publisher: IEEE
Year: 2008
Weight: 594 KB
Category: Article
ISBN: 1424428734
DOI: 10.1109/EPEP.2008.4675924

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