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[IEEE 2008 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Jyvaskyla, Finland (2008.09.10-2008.09.12)] 2008 European Conference on Radiation and Its Effects on Components and Systems - Modeling the effects of broadening and degradation of single event transient pulses in integrated circuits

✍ Scribed by Ribeiro, Ivandro; Wirth, Gilson; Kastensmidt, Fernanda Lima

Book ID: 126748353
Publisher: IEEE
Year: 2008
Weight: 270 KB
Category: Article
ISBN: 1457704811
DOI: 10.1109/RADECS.2008.5782710

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