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[IEEE 2008 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Jyvaskyla, Finland (2008.09.10-2008.09.12)] 2008 European Conference on Radiation and Its Effects on Components and Systems - TID effects in deep N-well CMOS monolithic active pixel sensors

✍ Scribed by Ratti, L.; Andreoli, C.; Gaioni, L.; Manghisoni, M.; Pozzati, E.; Re, V.; Traversi, G.

Book ID: 120545226
Publisher: IEEE
Year: 2008
Weight: 406 KB
Category: Article
ISBN: 1457704811
DOI: 10.1109/RADECS.2008.5782738

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