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[IEEE 2008 26th International Conference on Microelectronics (MIEL 2008) - Nis, Serbia and Montenegro (2008.05.11-2008.05.14)] 2008 26th International Conference on Microelectronics - An analysis of some semi-classical and quantum mechanical surface potential models of MOS inversion layer

✍ Scribed by Kevkic, T. S.; Petkovic, D. M.

Book ID: 111891755
Publisher: IEEE
Year: 2008
Weight: 272 KB
Volume: 0
Category: Article
ISBN: 142441881X
DOI: 10.1109/icmel.2008.4559257

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