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[IEEE 2008 26th International Conference on Microelectronics (MIEL 2008) - Nis, Serbia and Montenegro (2008.05.11-2008.05.14)] 2008 26th International Conference on Microelectronics - Failure analysis of high power white LEDs

✍ Scribed by Cassanelli, G.; Mura, G.; Fantini, F.; Vanzi, M.

Book ID: 111939448
Publisher: IEEE
Year: 2008
Weight: 176 KB
Volume: 0
Category: Article
ISBN: 142441881X
DOI: 10.1109/icmel.2008.4559272

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