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[IEEE 2008 26th International Conference on Microelectronics (MIEL 2008) - Nis, Serbia and Montenegro (2008.05.11-2008.05.14)] 2008 26th International Conference on Microelectronics - Comprehensive modeling of electromigration induced interconnect degradation mechanisms

✍ Scribed by Ceric, H.; Lacerda de Orio, R.; Selberherr, S.

Book ID: 126647101
Publisher: IEEE
Year: 2008
Weight: 689 KB
Category: Article
ISBN: 142441881X
DOI: 10.1109/ICMEL.2008.4559225

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