𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2008 1st IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems (NDCS 2008) - Cambridge, MA (2008.09.29-2008.09.30)] 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems - Characterization of the Displacement Tolerance of QCA Interconnects

✍ Scribed by Karim, Faizal; Walus, Konrad

Book ID: 121734821
Publisher: IEEE
Year: 2008
Weight: 689 KB
Category: Article
ISBN: 0769533795
DOI: 10.1109/NDCS.2008.9

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2008 1st IEEE International Worksh

[IEEE 2008 1st IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems (NDCS 2008) - Cambridge, MA (2008.09.29-2008.09.30)] 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems - Analytical Theory of Graphene Nanoribbon Transistors

✍ Zhao, Pei; Choudhury, Mihir; Mohanram, Kartik; Guo, Jing 📂 Article 📅 2008 🏛 IEEE ⚖ 189 KB

[IEEE 2008 1st IEEE International Worksh

[IEEE 2008 1st IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems (NDCS 2008) - Cambridge, MA (2008.09.29-2008.09.30)] 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems - New SRAM Cell Design for Low Power and High Reliability Using 32nm Independent Gate FinFET Technology

✍ Kim, Young Bok; Kim, Yong-Bin; Lombardi, Fabrizio 📂 Article 📅 2008 🏛 IEEE ⚖ 301 KB

[IEEE 2008 15th IEEE International Confe

[IEEE 2008 15th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2008) - St. Julien's, Malta (2008.08.31-2008.09.3)] 2008 15th IEEE International Conference on Electronics, Circuits and Systems - Design of current reuse CMOS LC-VCO

✍ Mohamed, Sherif; Ortmanns, Maurits; Manoli, Yiannos 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 408 KB

[IEEE 2008 11th International Workshop o

[IEEE 2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) - Bratislava, Slovakia (2008.04.16-2008.04.18)] 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems - Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration

✍ Starecek, Lukas; Sekanina, Lukas; Kotasek, Zdenek 📂 Article 📅 2008 🏛 IEEE ⚖ 433 KB

[IEEE 2008 15th IEEE International Confe

[IEEE 2008 15th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2008) - St. Julien's, Malta (2008.08.31-2008.09.3)] 2008 15th IEEE International Conference on Electronics, Circuits and Systems - Design of current-mode gm-C MLF elliptic filters for wireless receivers

✍ Zhu, Xi; Sun, Yichuang; Moritz, James 📂 Article 📅 2008 🏛 IEEE ⚖ 252 KB

[IEEE 2008 15th IEEE International Confe

[IEEE 2008 15th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2008) - St. Julien's, Malta (2008.08.31-2008.09.3)] 2008 15th IEEE International Conference on Electronics, Circuits and Systems - Design of a 2 μW RFID baseband processor featuring an AES cryptography primitive

✍ Ricci, A.; Grisanti, M.; De Munari, I.; Ciampolini, P. 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 248 KB