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[IEEE 2008 17th Asian Test Symposium - Sapporo (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - Digitally-Assisted Analog/RF Testing for Mixed-Signal SoCs

✍ Scribed by Hsiu-Ming Chang, ; Min-Sheng Lin, ; Kwang-Ting Cheng,

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