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[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - Technique to Improve the Performance of Time-Interleaved A-D Converters with Mismatches of Non-linearity

✍ Scribed by Asami, Koji; Suzuki, Hidetaka; Miyajima, Hiroyuki; Taura, Tetsuya; Kobayashi, Haruo

No coin nor oath required. For personal study only.

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