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[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme

✍ Scribed by Kim, Taejin; Chun, Sunghoon; Kim, Yongjoon; Yang, Myung-Hoon; Kang, Sungho

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