𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2007 IEEE International Integrated Reliability Workshop Final Report - South Lake Tahoe, CA, USA (2007.10.15-2007.10.18)] 2007 IEEE International Integrated Reliability Workshop Final Report - SRAM stability analysis considering gate oxide SBD, NBTI and HCI

✍ Scribed by Jin Qin, ; Xiaojun Li, ; Bernstein, Joseph B.

Book ID: 118208575
Publisher: IEEE
Year: 2007
Weight: 319 KB
Volume: 0
Category: Article
DOI: 10.1109/irws.2007.4469217

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2009 IEEE International Integrated

[IEEE 2009 IEEE International Integrated Reliability Workshop (IRW) - South Lake Tahoe, CA, USA (2009.10.18-2009.10.22)] 2009 IEEE International Integrated Reliability Workshop Final Report - TCAD analysis of self heating in AlGaN/GaN HEMTs under pulsed conditions

✍ Weatherford, T.; Wang, Y.; Tracey, S. 📂 Article 📅 2009 🏛 IEEE ⚖ 373 KB

[IEEE IEEE International Integrated Reli

[IEEE IEEE International Integrated Reliability Workshop Final Report, 2004 - S. Lake Tahoe, CA, USA (Oct. 18-21, 2004)] IEEE International Integrated Reliability Workshop Final Report, 2004 - Procedure for quantitative fWLR monitoring of gate dielectric reliability

✍ Vollertsen, R. 📂 Article 📅 2004 🏛 IEEE ⚖ 281 KB

[IEEE IEEE International Integrated Reli

[IEEE IEEE International Integrated Reliability Workshop, 1996. - Lake Tahoe, CA, USA (Oct. 20-23, 1996)] 1996 International Integrated Reliability Workshop Final Report - Thickness and temperature effects on TDDB for DC and dynamic stressing of thin oxide

✍ Soh, S.-H.; Naidu, M.; Hwu, J.; Sadwick, L. 📂 Article 📅 1996 🏛 IEEE ⚖ 449 KB