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[IEEE 2007 Annual Reliability and Maintainability Symposium - Orlando, FL (2007.01.22-2007.01.25)] 2007 Annual Reliability and Maintainability Symposium - Modeling and optimization of extended warranties using probabilistic design

✍ Scribed by Vittal, S.; Phillips, R.

Book ID: 126767540
Publisher: IEEE
Year: 2007
Weight: 250 KB
Category: Article
ISBN-13: 9780780397668
DOI: 10.1109/RAMS.2007.328045

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