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[IEEE 2007 Annual Reliability and Maintainability Symposium - Orlando, FL (2007.01.22-2007.01.25)] 2007 Annual Reliability and Maintainability Symposium - Realistic reliability requirements for the stresses in use

✍ Scribed by Krasich, M.

Book ID: 120595537
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 178 KB
Category: Article
ISBN-13: 9780780397668
DOI: 10.1109/RAMS.2007.328100

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