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[IEEE 2007 Proceedings Annual Reliability and Maintainability Sympsoium - Orlando, FL, USA (2007.01.22-2007.01.25)] 2007 Proceedings - Annual Reliability and Maintainability Sympsoium - Reliability and Degradation Modeling with Random or Uncertain Failure Threshold

✍ Scribed by Wang, Peng; Coit, David

Book ID: 126478647
Publisher: IEEE
Year: 2007
Weight: 233 KB
Category: Article
ISBN-13: 9780780397675
DOI: 10.1109/RAMS.2007.328107

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