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[IEEE 2007 9th International Conference - The Experience of Designing and Applications of CAD Systems in Microelectronics - Lviv, Ukraine (2007.2.19-2007.2.24)] 2007 9th International Conference - The Experience of Designing and Applications of CAD Systems in Microelectronics - Comprehensive Approach to Web Applications Testing and Performance Analysis

✍ Scribed by Murlewski, Jan; Wojciechowski, Jaroslaw; Sakowicz, Bartosz; Napieralski, Andrzej

Book ID: 121881998
Publisher: IEEE
Year: 2007
Weight: 378 KB
Category: Article
DOI: 10.1109/CADSM.2007.4297607

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