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[IEEE 2007 9th International Conference - The Experience of Designing and Applications of CAD Systems in Microelectronics - Lviv, Ukraine (2007.2.19-2007.2.24)] 2007 9th International Conference - The Experience of Designing and Applications of CAD Systems in Microelectronics - Verification Challenges of NoC Architectures

✍ Scribed by Hahanov, Vladimir; Yegorov, Oleksandr; Mostova, Karyna; Kovalyov, Eugene

Book ID: 120545151
Publisher: IEEE
Year: 2007
Weight: 615 KB
Category: Article
DOI: 10.1109/CADSM.2007.4297543

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