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[IEEE 2007 65th Annual Device Research Conference - South Bend, IN, USA (2007.06.18-2007.06.20)] 2007 65th Annual Device Research Conference - Progress in GaN Performances and Reliability

✍ Scribed by Saunier, P.; Lee, C.; Balistreri, A.; Dumka, D.; Jimenez, J.; Tserng, H. Q.; Kao, M.Y.; Chao, P.C.; Chu, K.; Souzis, A.; Eliashevich, I.; Guo, S.; del Alamo, J.; Joh, J.; Shur, M.

Book ID: 127297380
Publisher: IEEE
Year: 2007
Weight: 382 KB
Category: Article
ISBN: 1424411025
DOI: 10.1109/drc.2007.4373639

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