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[IEEE 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers. - Honolulu, HI, USA (June 13-15, 2006)] 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers. - Balancing SoC Design and Technology Challenges at 45nm

✍ Scribed by Stork, J.

Book ID: 126660136
Publisher: IEEE
Year: 2006
Weight: 560 KB
Category: Article
ISBN-13: 9781424400058
DOI: 10.1109/VLSIT.2006.1705188

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