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[IEEE 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers. - Honolulu, HI, USA (June 13-15, 2006)] 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers. - Technology Breakthrough of Body-Tied FinFET for sub 50 nm NOR Flash Memory

✍ Scribed by Cho, E.; Kim, T.-Y.; Cho, B.; Lee, C.-H.; Lee, J.; Fayrushin, A.; Lee, C.; Park, D.; Ryu, B.-I.

Book ID: 121381699
Publisher: IEEE
Year: 2006
Weight: 453 KB
Category: Article
ISBN-13: 9781424400058
DOI: 10.1109/VLSIT.2006.1705231

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