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[IEEE 2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers. - Honolulu, HI, USA (June 15-17, 2006)] 2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers. - Finger Vein Authentication Technology and Its Future

✍ Scribed by Hashimoto, J.

Book ID: 125804665
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 394 KB
Category: Article
ISBN-13: 9781424400065
DOI: 10.1109/VLSIC.2006.1705285

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