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[IEEE 2006 IEEE International Vacuum Electronics Conference held Jointly with 2006 IEEE International Vacuum Electron Sources - Monterey, CA, USA (25-27 April 2006)] 2006 IEEE International Vacuum Electronics Conference held Jointly with 2006 IEEE International Vacuum Electron Sources - A Compact Cathode Performance Test System

✍ Scribed by Jiancan Yang, ; Yiman Wang, ; Zuoren Nie, ; Jinshu Wang, ; Youliang Lu, ; Kexin Zhao,

Book ID: 126932001
Publisher: IEEE
Year: 2006
Weight: 735 KB
Category: Article
ISBN-13: 9781424401086
DOI: 10.1109/ivelec.2006.1666324

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