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[IEEE 2006 IEEE International Vacuum Electronics Conference held Jointly with 2006 IEEE International Vacuum Electron Sources - Monterey, CA, USA (25-27 April 2006)] 2006 IEEE International Vacuum Electronics Conference held Jointly with 2006 IEEE International Vacuum Electron Sources - Characterization of Commonly Used Cold Cathodes in Explosive Emission Diodes

โœ Scribed by Verma, R.; Shyam, A.; Chaturvedi, S.; Lathi, D.; Chaudhary, V.; Shukla, R.; Sharma, S.; Sonara, J.; Shah, K.; Adhikary, B.; Mehida, R.; Bhavsar, T.; Mehta, C.


Book ID
121847396
Publisher
IEEE
Year
2006
Weight
691 KB
Category
Article
ISBN-13
9781424401086

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