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[IEEE 2006 IEEE International Vacuum Electronics Conference held Jointly with 2006 IEEE International Vacuum Electron Sources - Monterey, CA, USA (25-27 April 2006)] 2006 IEEE International Vacuum Electronics Conference held Jointly with 2006 IEEE International Vacuum Electron Sources - Application of CAD Simulation Technology in Microwave Tube Research and Fabrication

✍ Scribed by Zhaojun Zhu, ; Baofu Jia, ; Zhengxiang Luo,

Book ID: 120986694
Publisher: IEEE
Year: 2006
Weight: 420 KB
Category: Article
ISBN-13: 9781424401086
DOI: 10.1109/IVELEC.2006.1666212

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