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[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - SOI Poly-defined Diode for ESD Protection in High Speed I/Os

✍ Scribed by Chen, Victor; Salman, Akram; Beebe, Stephen; Rosenbaum, Elyse; Mitra, Souvick; Putnam, Chris; Gauthier, Robert

Book ID: 123613364
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 103 KB
Category: Article
ISBN-13: 9780780394988
DOI: 10.1109/RELPHY.2006.251299

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