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[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - BVCER - Increased Operating Voltage for SiGe HBTs

✍ Scribed by Kraft, Jochen; Loffler, Bernhard; Ribic, Nikolaus; Wachmann, Ewald

Book ID: 121788815
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 250 KB
Category: Article
ISBN-13: 9780780394988
DOI: 10.1109/RELPHY.2006.251270

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