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[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Retention Reliability of FinFET SONOS Device

✍ Scribed by Lee, Jong; Lee, Se; Chae, Heesoon; Choi, Byung; Sung, Suk-kang; Kim, Seok; Cho, Eun; Lee, Choong; Park, Donggun

Book ID: 120298143
Publisher: IEEE
Year: 2006
Weight: 558 KB
Category: Article
ISBN-13: 9780780394988
DOI: 10.1109/RELPHY.2006.251274

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