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[IEEE 2006 IEEE Design and Diagnostics of Electronic Circuits and systems - Prague, Czech Republic (April 18-21, 2006)] 2006 IEEE Design and Diagnostics of Electronic Circuits and systems - Multiple-Vector Column-Matching BIST Design Method

✍ Scribed by Fiser, P.; Kubatova, H.

Book ID: 126684928
Publisher: IEEE
Year: 2006
Weight: 281 KB
Category: Article
ISBN-13: 9781424401857
DOI: 10.1109/DDECS.2006.1649633

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