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[IEEE 2006 IEEE Design and Diagnostics of Electronic Circuits and systems - Prague, Czech Republic (April 18-21, 2006)] 2006 IEEE Design and Diagnostics of Electronic Circuits and systems - Concurrent Testing of Digital Circuits for Advanced Fault Models

✍ Scribed by Biswas, S.; Mukhopadhyay, S.; Patra, A.; Sarkar, D.

Book ID: 125808727
Publisher: IEEE
Year: 2006
Weight: 224 KB
Category: Article
ISBN-13: 9781424401857
DOI: 10.1109/DDECS.2006.1649612

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