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[IEEE 2006 IEEE Design and Diagnostics of Electronic Circuits and systems - Prague, Czech Republic (April 18-21, 2006)] 2006 IEEE Design and Diagnostics of Electronic Circuits and systems - Generation and Propagation of Single Event Transients in CMOS Circuits

✍ Scribed by Wirth, G.I.; Vieira, M.G.; Neto, E.H.; Kastensmidt, F.L.

Book ID: 120258923
Publisher: IEEE
Year: 2006
Weight: 292 KB
Category: Article
ISBN-13: 9781424401857
DOI: 10.1109/DDECS.2006.1649611

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