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[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - Power-Aware Test Data Compression for Embedded IP Cores

✍ Scribed by Badereddine, N.; Wang, Z.; Girard, P.; Chakrabarty, K.; Pravossoudovitch, S.; Landrault, C.

No coin nor oath required. For personal study only.

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