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[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure

✍ Scribed by Kim, Youbean; Song, Dongsup; Kim, Kicheol; Kim, Incheol; Kang, Sungho

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