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[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects

✍ Scribed by Lin, Xijiang; Tsai, Kun-han; Wang, Chen; Kassab, Mark; Rajski, Janusz; Kobayashi, Takeo; Klingenberg, Randy; Sato, Yasuo; Hamada, Shuji; Aikyo, Takashi

Book ID: 120288808
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 249 KB
Category: Article
ISBN-13: 9780769526287
DOI: 10.1109/ATS.2006.261012

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