𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Maximum temperature increases in the head and brain for SAR averaging schemes prescribed in safety guidelines

✍ Scribed by Hirata, A.; Jianqing Wang, ; Fujiwara, O.; Fujimoto, M.; Shiozawa, T.

Book ID: 126716446
Publisher: IEEE
Year: 2005
Weight: 221 KB
Volume: 3
Category: Article
ISBN-13: 9780780393806
DOI: 10.1109/ISEMC.2005.1513634

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