𝔖 Bobbio Scriptorium

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[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - On measurements for EIRP compliance of UWB devices

✍ Scribed by Brunett, J.D.; Ringler, R.M.; Liepa, V.V.

Book ID: 120087533
Publisher: IEEE
Year: 2005
Weight: 154 KB
Volume: 2
Category: Article
ISBN-13: 9780780393806
DOI: 10.1109/ISEMC.2005.1513561

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