𝔖 Bobbio Scriptorium

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[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Examination of electronic module immunity using transfer functions

✍ Scribed by Chingchi Chen,

Book ID: 125428052
Publisher: IEEE
Year: 2005
Weight: 226 KB
Volume: 3
Category: Article
ISBN-13: 9780780393806
DOI: 10.1109/isemc.2005.1513625

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