𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - RFI-induced failures in switched capacitor circuits

✍ Scribed by Crovetti, P.S.; Fiori, F.

Book ID: 121837679
Publisher: IEEE
Year: 2005
Weight: 126 KB
Volume: 1
Category: Article
ISBN-13: 9780780393806
DOI: 10.1109/ISEMC.2005.1513471

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