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[IEEE 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT) - Hsinchu, Taiwan (27-29 April 2005)] 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). - On-chip network evolution using NetC

✍ Scribed by Liwei Ma, ; Yihe Sun,

Book ID: 126609715
Publisher: IEEE
Year: 2005
Weight: 730 KB
Category: Article
ISBN-13: 9780780390607
DOI: 10.1109/VDAT.2005.1500067

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