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[IEEE 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT) - Hsinchu, Taiwan (27-29 April 2005)] 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). - A high linearity low noise amplifier in a 0.35μm SiGe BiCMOS for WCDMA applications

✍ Scribed by Chih-Wei Wang, ; Yi-Bin Lee, ; Tzu-Yi Yang,

Book ID: 120830541
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 657 KB
Category: Article
ISBN-13: 9780780390607
DOI: 10.1109/VDAT.2005.1500043

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