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[IEEE 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation & amp; Test (VLSI-TSA-DAT) - Hsinchu, Taiwan (27-29 April 2005)] 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). - The limitations in applying analytic design equations for optimal class E RF power amplifiers design

✍ Scribed by Lie, D.Y.C.; Lee, P.; Popp, J.D.; Rowland, J.F.; Ng, H.H.; Yang, A.H.

Book ID: 121755182
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 850 KB
Category: Article
ISBN-13: 9780780390607
DOI: 10.1109/VDAT.2005.1500045

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