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[IEEE 2005 IEEE Conference on Electron Devices and Solid-State Circuits - Hong Kong (19-21 Dec. 2005)] 2005 IEEE Conference on Electron Devices and Solid-State Circuits - A 2-D Threshold-Voltage Model for Small MOSFET with Quantum-Mechanical Effects

✍ Scribed by J. P. Xu, Y. P. Li

Book ID: 126597498
Publisher: IEEE
Year: 2005
Weight: 560 KB
Category: Article
ISBN-13: 9780780393394
DOI: 10.1109/EDSSC.2005.1635254

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