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[IEEE 2005 IEEE Conference on Electron Devices and Solid-State Circuits - Hong Kong (19-21 Dec. 2005)] 2005 IEEE Conference on Electron Devices and Solid-State Circuits - Characterization of LO leakage behavior in Transconductance Mixers

✍ Scribed by V. H. Le, Q. K Tran

Book ID: 120233510
Publisher: IEEE
Year: 2005
Weight: 405 KB
Category: Article
ISBN-13: 9780780393394
DOI: 10.1109/EDSSC.2005.1635307

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