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[IEEE 2005 IEEE Conference on Electron Devices and Solid-State Circuits - Hong Kong (19-21 Dec. 2005)] 2005 IEEE Conference on Electron Devices and Solid-State Circuits - An Analytical Parameter Extraction of the Small-Signal Model for RF MOSFETs

✍ Scribed by Y.S. Chi, J. X. Lu

Book ID: 118122215
Publisher: IEEE
Year: 2005
Weight: 551 KB
Volume: 0
Category: Article
ISBN-13: 9780780393394
DOI: 10.1109/edssc.2005.1635332

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