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[IEEE 2010 IEEE International Conference of Electron Devices and Solid- State Circuits (EDSSC) - Hong Kong (2010.12.15-2010.12.17)] 2010 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - RF parameter extraction of Bulk FinFET: A non quasi static approach

✍ Scribed by Kundu, Atanu; Syamal, Binit; Koley, Kalyan; Sarkar, C K; Mohankumar, N

Book ID: 118150864
Publisher: IEEE
Year: 2010
Weight: 970 KB
Volume: 0
Category: Article
ISBN: 1424499976
DOI: 10.1109/edssc.2010.5713679

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