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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Emission and immunity testing: test object electrical size and its implication

✍ Scribed by Wilson, P.

Book ID: 126166650
Publisher: IEEE
Year: 2004
Weight: 282 KB
Volume: 2
Category: Article
ISBN-13: 9780780384439
DOI: 10.1109/ISEMC.2004.1349813

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