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[IEEE 2004 IEEE International Workshop on Current and Defect Based Testing - Napa Valley, CA, USA (25 April 2004)] Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004) - Delay testing based on transition faults propagated to all reachable outputs

✍ Scribed by Vaidya, B.; Tahoori, M.B.

Book ID: 118221325
Publisher: IEEE
Year: 2004
Weight: 581 KB
Volume: 0
Category: Article
ISBN-13: 9780780389502
DOI: 10.1109/dbt.2004.1408958

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