[IEEE 2004 IEEE International Workshop on Current and Defect Based Testing - Napa Valley, CA, USA (25 April 2004)] Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004) - Test volume reduction via flip-flop compatibility analysis for balanced parallel scan

✍ Scribed by Ashouei, M.; Chatterjee, A.; Singh, A.

• Book ID: 121300253
• Publisher: IEEE
• Year: 2004
• Weight: 285 KB
• Category: Article
• ISBN-13: 9780780389502
• DOI: 10.1109/DBT.2004.1408969