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[IEEE Proceedings. Ninth IEEE International High-Level Design Validation and Test Workshop (IEEE Cat. No.04EX940) - Sonoma Valley, CA, USA (2004.11.10-2004.11.12)] Proceedings. Ninth IEEE International High-Level Design Validation and Test Workshop (IEEE Cat. No.04EX940) - Enhancing the efficiency of Bayesian network based coverage directed test generation

โœ Scribed by Braun, M.; Fine, S.; Ziv, A.

Book ID
115502987
Publisher
IEEE
Year
2004
Weight
480 KB
Volume
0
Category
Article
ISBN-13
9780780387140

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