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[IEEE 2004 IEEE International SOI Conference - Charleston, SC, USA (4-7 Oct. 2004)] 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) - Fabrication and operation of sub-50 nm strained-Si on Si/sub 1-x/Ge/sub x/ Insulator (SGOI) CMOSFETs

✍ Scribed by Sadaka, M.; Thean, A.V.-Y.; Barr, A.; Tekleab, D.; Kalpat, S.; White, T.; Nguyen, T.; Mora, R.; Beckage, P.; Jawarani, D.; Zollner, S.; Kottke, M.; Liu, R.; Canonico, M.; Xie, Q.-H.; Wang, X.-D.; Parsons, S.; Eades, D.; Zavala, M.; Nguyen, B.-Y.; Mazure, C.; Mogab, J.

Book ID: 126605211
Publisher: IEEE
Year: 2004
Weight: 243 KB
Category: Article
ISBN-13: 9780780384972
DOI: 10.1109/SOI.2004.1391620

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