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[IEEE 2004 IEEE International SOI Conference - Charleston, SC, USA (4-7 Oct. 2004)] 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) - Influence of a Tunneling Gate Current on the noise performance of SOI MOSFETs

✍ Scribed by Pailloncy, G.; Iniguez, B.; Dambrine, G.; Danneville, F.

Book ID: 121487104
Publisher: IEEE
Year: 2004
Weight: 178 KB
Category: Article
ISBN-13: 9780780384972
DOI: 10.1109/SOI.2004.1391553

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